A comparison of different phase calculation methods that can be used to obtain phase information from the fringes formed by diffraction phase microscopy is presented. As a quantitative phase imaging method, white light diffraction phase microscopy can provide an interferogram non-invasively. Thin film surfaceinterferograms have been retrieved by the white light diffraction phase microscopy which is composed of anoptical microscope and a Mach–Zehnder interferometer. There are several techniques for the determination ofphase from interferograms. Fourier transform and continuous wavelet transform are the most commonly used methods for phase calculation. Stockwell transform is defined as a phase-corrected version of the continuouswavelet transform method, which is the basis of multi-resolution signal analysis methods. In this study,for the phase calculation of interferograms, Fourier transform, continuous wavelet transforms with Morlet, Paul and zero-order generalized Morse wavelet, and Stockwell transform phase methods have been compared in terms of the precision and the implementation.